Martil De La Plaza, I., González Díaz, G., Martínez, F., Selle, B., & Sieber, I. (1998). Influence of rapid thermal annealing processes on the properties of SiNx: H films deposited by the electron cyclotron resonance method. Elsevier Science BV.
Citación estilo ChicagoMartil De La Plaza, Ignacio, Germán González Díaz, F.L Martínez, B. Selle, y I. Sieber. Influence of Rapid Thermal Annealing Processes On the Properties of SiNx: H Films Deposited By the Electron Cyclotron Resonance Method. Elsevier Science BV, 1998.
Cita MLAMartil De La Plaza, Ignacio, et al. Influence of Rapid Thermal Annealing Processes On the Properties of SiNx: H Films Deposited By the Electron Cyclotron Resonance Method. Elsevier Science BV, 1998.
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